Diagnostics of complex-functional ECB during radiation resistance tests

Abstract

The ionizing radiation of outer space provokes the appearance of radiation effects in the electronic component base (ECB) of spacecraft. The resulting radiation effects depend on the semiconductor structures used. Therefore, the topic of work related to the diagnosis of electronic components during testing for radiation resistance is relevant. The article discusses examples of diagnostics of such complex functional microcircuits as a microcontroller and a processor system on a chip. The functional control algorithm of the tested microcircuit includes testing the on-chip RAM, ADC, microcircuit core (ALU), UART, SPI serial interfaces. After the analysis of the functional capabilities of the microcircuit and the capabilities of test facilities and auxiliary equipment, it was decided to use the double control technique. This technique, when testing complex-functional products of electronic technology, provides control of the static parameters of the microcircuit and functional control of one core according to a given algorithm. To control microcircuits during radiation resistance testing, a functional control unit was developed, which includes a specialized testing board and implements various RAM testing modes (writing, storing, cyclic reading of information).