Diagnosis of Voltage Dependent Scan Chain Failure Using VBUMP Scan Debug Method

Khusyari, K.; Ng, Wei Tee; Jaarsma, N.; Abraham, R. G.; Ng, Peng Weng; Ang, Boon Hui; Ong, Chin Hu

doi:10.1109/ats.2008.66

Cited by 10 publications

(2 citation statements)

References 2 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…Therefore, several scan-chain-diagnosis methods have been studied. Special-tester-based diagnostic methods [ 13 , 14 , 15 , 16 ] use a tester to control the scan operation and physical failure analysis equipment to identify the defective scan cells and locations of defective dies. These methods provide high resolution and accuracy.…”

Section: Introductionmentioning

confidence: 99%

Scan-Chain-Fault Diagnosis Using Regressions in Cryptographic Chips for Wireless Sensor Networks

Lim

Cheong

Kang

2020

Sensors

View full text Add to dashboard Cite

Scan structures, which are widely used in cryptographic circuits for wireless sensor networks applications, are essential for testing very-large-scale integration (VLSI) circuits. Faults in cryptographic circuits can be effectively screened out by improving testability and test coverage using a scan structure. Additionally, scan testing contributes to yield improvement by identifying fault locations. However, faults in circuits cannot be tested when a fault occurs in the scan structure. Moreover, various defects occurring early in the manufacturing process are expressed as faults of scan chains. Therefore, scan-chain diagnosis is crucial. However, it is difficult to obtain a sufficiently high diagnosis resolution and accuracy through the conventional scan-chain diagnosis. Therefore, this article proposes a novel scan-chain diagnosis method using regression and fan-in and fan-out filters that require shorter training and diagnosis times than existing scan-chain diagnoses do. The fan-in and fan-out filters, generated using a circuit logic structure, can highlight important features and remove unnecessary features from raw failure vectors, thereby converting the raw failure vectors to fan-in and fan-out vectors without compromising the diagnosis accuracy. Experimental results confirm that the proposed scan-chain-diagnosis method can efficiently provide higher resolutions and accuracies with shorter training and diagnosis times.

show abstract

Section: Introductionmentioning

confidence: 99%

Scan-Chain-Fault Diagnosis Using Regressions in Cryptographic Chips for Wireless Sensor Networks

Lim

Cheong

Kang

2020

Sensors

View full text Add to dashboard Cite

show abstract

“…Sometimes, physical failure analysis (PFA) equipments are used together with tester to observe defective responses at different locations to identify a failing scan cell. The methodologies proposed in [DE95] [SON04] [STE04] [HWA08] [KHU08] belong to tester-based chain diagnosis. These techniques normally provide very good diagnosis resolution.…”

Section: Introductionmentioning

confidence: 99%

Scan Chain Diagnosis by Adaptive Signal Profiling with Manufacturing ATPG Patterns

Huang

Cheng

Guo

et al. 2009

2009 Asian Test Symposium

View full text Add to dashboard Cite

In the past, software based scan chain defect diagnosis can be roughly classified into two categories (1) model-based algorithms, and (2) data-driven algorithms. In this paper we first analyze the advantages and disadvantages of each category of the chain diagnosis algorithms. Next, an adaptive signal profiling algorithm that can use manufacturing ATPG scan patterns is proposed for scan chain diagnosis. Finally, several case studies and their PFA results are presented to validate the accuracy and effectiveness of the proposed algorithm.

show abstract

An Efficient Scan Diagnosis for Intermittent Faults Using CNN With Multi-Channel Data

Yun,

Lim,

Lee

et al. 2024

IEEE Access

View full text Add to dashboard Cite

Diagnosis of Voltage Dependent Scan Chain Failure Using VBUMP Scan Debug Method

Cited by 10 publications

References 2 publications

Scan-Chain-Fault Diagnosis Using Regressions in Cryptographic Chips for Wireless Sensor Networks

Scan-Chain-Fault Diagnosis Using Regressions in Cryptographic Chips for Wireless Sensor Networks

Scan Chain Diagnosis by Adaptive Signal Profiling with Manufacturing ATPG Patterns

An Efficient Scan Diagnosis for Intermittent Faults Using CNN With Multi-Channel Data

Contact Info

Product

Resources

About