Diagnosis of EMI to laptop WWAN device from TFT-LCD driver using non-contact measurement-based transfer function technique

Chen, K.-S.; Horng, Tzyy‐Sheng; Ho, Ching-Yen; Wu, Jiming; Peng, Kang-Chun

doi:10.1109/isemc.2010.5711289

Cited by 4 publications

(2 citation statements)

References 6 publications

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“…In recent years, the vector network analyzer (VNA) measurement has shown potential in EMC applications because it can be used to measure S-parameters, which correlate with the electromagnetic emission and susceptibility. Applications of VNA include measuring the Sparameters that describe the conversion from differential to common mode to elucidate the radiation mechanisms [14,15], and measuring the transfer function of the coupling path which is correlated with conducted susceptibility [16]. By coupling external disturbance to harness, bulk current injection (BCI) probes have also proven effective for simulating radiation-induced effects in conducted susceptibility tests [17].…”

Section: Introductionmentioning

confidence: 99%

Estimating Radiated Emission Reduction From Printed Circuit Board Using Vector Network Analyzer With a Bulk Current Injection Probe

Ho¹,

Chen²,

Horng³

2013

PIER

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Abstract-A vector network analyzer (VNA) with a bulk current injection (BCI) probe is proposed to measure the transmission coefficient of a PCB. The purpose of developing such a measurement techniques is to predict the radiated emission for good correlation with the fully-anechoic chamber measured results. In this study, the proposed method is used to determine the radiated emission from a DC supply loop. Moreover, the proposed method can be further used to accurately predict the reduction of radiated emission from the improved DC supply loop. Electromagnetic simulations is also developed to confirm the accuracy of the proposed techniques.

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Section: Introductionmentioning

confidence: 99%

Estimating Radiated Emission Reduction From Printed Circuit Board Using Vector Network Analyzer With a Bulk Current Injection Probe

Ho¹,

Chen²,

Horng³

2013

PIER

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show abstract

“…Recent applications of network analyzer include measurements of S-parameters used to elucidate radiation mechanisms by describing the conversion from differential to common mode [14,15], and measurements of the transfer function of the coupling path that correlates with conducted susceptibility [16]. By coupling external disturbance to harness, bulk current injection (BCI) probes have also proven effective for simulating radiation-induced effects in conducted susceptibility tests [17].…”

Section: Introductionmentioning

confidence: 99%

Estimating the Reduction of Radiated Emissions From TFT-LCD Panel Using Network Analyzer With a Bulk Current Injection Probe

Ho¹,

Chen²,

Horng³

et al. 2013

PIER

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Abstract-A network analyzer with a bulk current injection (BCI) probe is proposed to measure the common-mode conversion coefficient for DC supply loops on a driver PCB of thin film transistor-liquid crystal display (TFT-LCD) panel. The proposed technique is used to predict the common-mode radiated emission caused by the DC supply loops, which highly correlates with the radiated emission measurements obtained for the TFT-LCD panel in a fully anechoic chamber (FAC). The proposed technique is also successful to estimate the reduction of a specific peak in the radiated emission spectrum by shielding the DC supply loops on a driver PCB of TFT-LCD panel. Electromagnetic simulation and equivalent-circuit modeling approaches are developed to confirm the common-mode radiation mechanism in this study.

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PC client platform RFI risks and mitigation methodologies

Han

Hsu

Chen

et al. 2015

2015 IEEE Symposium on Electromagnetic Compatibility and Signal Integrity

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Diagnosis of EMI to laptop WWAN device from TFT-LCD driver using non-contact measurement-based transfer function technique

Cited by 4 publications

References 6 publications

Estimating Radiated Emission Reduction From Printed Circuit Board Using Vector Network Analyzer With a Bulk Current Injection Probe

Estimating Radiated Emission Reduction From Printed Circuit Board Using Vector Network Analyzer With a Bulk Current Injection Probe

Estimating the Reduction of Radiated Emissions From TFT-LCD Panel Using Network Analyzer With a Bulk Current Injection Probe

PC client platform RFI risks and mitigation methodologies

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