Diagnosis of Board-Level Functional Failures Under Uncertainty Using Dempster–Shafer Theory

Abstract

Despite recent advances in structural test methods, the diagnosis of the root cause of board-level failures for functional tests remains a major challenge. A promising approach to address this problem is to carry out fault diagnosis in two phases-suspect faulty components on the board or modules within components (together referred to as blocks in this paper) are first identified and ranked, and then fine-grained diagnosis is used to target the suspect blocks in a ranked order. We propose a new method based on dataflow analysis and DempsterShafer (DS) theory for ranking faulty blocks in the first phase of diagnosis. The proposed approach transforms the information derived from one functional test failure into multiple-stage failures by partitioning the given functional test into multiple stages. A measure of "belief" is then assigned to each block based on the knowledge of each failing stage, and the DS theory is subsequently used to aggregate the beliefs from multiple failing stages. Blocks with higher beliefs are ranked on the top of the candidate list. Simulations on an industry design for a network interface application as well as on an open source system-ona-chip show that the proposed method can provide accurate ranking for most board-level functional failures. Index Terms-Board-level, dataflow analysis, Dempster-Shafer (DS) theory, diagnosis, functional failure.

Knowledge discovery and knowledge transfer in board-level functional fault diagnosis

“…However, additional issues e.g., signal integrity, power-supply noise and crosstalk involving multiple active chips, must be considered. Functional testing is also challenging because of limits on controllability and observability in functional mode [9], [10].…”

Handling Missing Syndromes in Board-Level Functional-Fault Diagnosis

“…At the chip vendor location, chips are tested in a standalone mode in a controlled environment, but additional issues, such as signal integrity, power-supply noise and crosstalk involving multiple active chips, must be considered during board-level test [6]. Functional testing is also challenging because of limits on controllability and observability in functional mode [8].…”

Adaptive Board-Level Functional Fault Diagnosis Using Decision Trees

“…However, additional issues during board-level test, e.g., signal integrity, power-supply noise and crosstalk involving multiple active chips, must be considered [9]. Functional testing is also challenging because of limits on controllability and observability in functional mode [10], [11].…”

“…Reasoning-based methods are becoming popular today since detailed system models are not needed to construct the diagnosis system [10], [15]- [17]. Repairs of faulty components are suggested through a ranked list of potential faulty components, e.g., based on Bayesian inference [15] and Dempster-Shafer theory [10].…”

“…Repairs of faulty components are suggested through a ranked list of potential faulty components, e.g., based on Bayesian inference [15] and Dempster-Shafer theory [10]. Machine-learning techniques have also been developed for accurate diagnosis.…”