“…They can also provide valuable feedback for achieving faulttolerance through calibration, tuning, or even reconfigurability [42,43,44,45,46]. Finally, DFT and BIST techniques can provide valuable feedback for diagnosis purposes [47,48,49,50,51,52,53,54,55,56,57,58,59]. Diagnosing the root-causes of failures in the first prototypes helps to reduce design iterations and to meet the time-to-market goal.…”