Diagnosing multiple faulty chains with low pin convolution compressor using compressed production test set

Kundu, Subrata; Kumar, K. Nirmal; Kumar, Rishi; Kapur, R.

doi:10.1109/test.2017.8242048

2017 IEEE International Test Conference (ITC) 2017

DOI: 10.1109/test.2017.8242048

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Diagnosing multiple faulty chains with low pin convolution compressor using compressed production test set

Subrata Kundu¹,

K. Nirmal Kumar²,

Rishi Kumar³

et al.

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Diagnosing multiple faulty chains with low pin convolution compressor using compressed production test set

Cited by 1 publication

References 16 publications

Diagnosing Double Faulty Chains through Failing Bit Separation

Diagnosing Double Faulty Chains through Failing Bit Separation

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