Given a physical device as a black box, one can in principle fully reconstruct its input-output transfer function by repeatedly feeding different input probes through the device and performing different measurements on the corresponding outputs. However, for such a complete tomographic reconstruction to work, full knowledge of both input probes and output measurements is required. Such an assumption is not only experimentally demanding, but also logically questionable, as it produces a circular argument in which the characterization of unknown devices appears to require other devices to have been already characterized beforehand. Here, we introduce a method to overcome such limitations present in usual tomographic techniques. We show that, even without any knowledge about the tomographic apparatus, it is still possible to infer the unknown device to a high degree of precision, solely relying on the observed data. This is achieved by employing a criterion that singles out the minimal explanation compatible with the observed data. Our method, that can be seen as a data-driven analog of tomography, is solved analytically and implemented as an algorithm for the learning of qubit channels.Quantum process tomography [1-9] is the standard protocol employed to reconstruct an unknown physical device, regarded as a black box. In a tomographic reconstruction, probes are repeatedly fed as inputs to the black box and measured at the output. The input-output transfer function of the black box can be reconstructed based on the correlations observed between the probes' preparations and the outcomes recorded in the final measurements. Such a reconstruction is reliable, however, only under the assumption that the entire tomographic procedure, comprising the probes' preparations and the final measurements, is fully known and trusted. Such an assumption, beside being quite demanding to fulfill in practice, is also unsatisfactory from a fundamental viewpoint, because it suggests that the knowledge required to implement tomography can only be obtained by recursively resorting to another tomographic reconstruction, and so on, ad infinitum.Here, we propose to solve such an impasse by adopting a data-driven (DD) approach [10-14] to data analysis in physical experiments. Such an approach relaxes any specific assumption about the devices involved in the experiment, in the sense that it does not require any knowledge of the input probes' preparations, nor of the final measurement settings (measurements for short). We then want to infer the unknown device only on the basis of the correlations observed in the data, without any assumption on the apparatus that was used to produce them, and with respect to any prior information that may (or may not) be already known about the device. We refer to such a task as DD inference of a physical device.However, the inference which explains the observed correlations is, generally speaking, not unique: clearly, the same set of observed correlations can be explained in many different ways, and each possibl...