2010 35th IEEE Photovoltaic Specialists Conference 2010
DOI: 10.1109/pvsc.2010.5615949
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Device characterization of (AgCu)(InGa)Se<inf>2</inf> solar cells

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Cited by 29 publications
(30 citation statements)
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“…There is a voltage dependence in the short wavelength range, as the negative applied potential improves collection of the blue part of the spectrum in the backwall devices. We have shown previously [8] that Ag-alloying reduces the voltage-dependent collection of typical substrate devices, which is in contrast with our current results.…”
Section: Resultscontrasting
confidence: 99%
See 1 more Smart Citation
“…There is a voltage dependence in the short wavelength range, as the negative applied potential improves collection of the blue part of the spectrum in the backwall devices. We have shown previously [8] that Ag-alloying reduces the voltage-dependent collection of typical substrate devices, which is in contrast with our current results.…”
Section: Resultscontrasting
confidence: 99%
“…One approach is Ag-alloying of the absorber layer to form (Ag,Cu)(In,Ga)Se 2 (ACIGS). Alloying the absorber layer with Ag increases the bandgap and decreases the melting point of the alloy which may allow films to be deposited with lower defect density than other Cu(In,Ga)Se 2 alloys [8]. Evidence of this has been reported with improved device performance [9] and sharper band tails [10].…”
Section: Introductionmentioning
confidence: 99%
“…As a defect moves towards mid-gap, it becomes an increasingly effective recombination center, and the ideality factor, A, should move towards 2. Increasing the Ga/(In+Ga) content of a ACIGS or CIGS solar cell does cause A to tend towards 2, as the recombination center moves closer to mid-gap [13].…”
Section: Historical Datamentioning
confidence: 99%
“…A broad single‐phase region (no miscibility gap observed in thin films) and lower melting point allow for lower deposition temperatures as compared with CIGS, which is interesting for applications in tandem devices or on polyimide substrates . It is suggested that the latter feature leads to lower defect densities, reduces the amount of structural disorder, and improves the minority carrier diffusion length . In addition, significantly larger grains are observed, especially for higher Ga contents .…”
Section: Introductionmentioning
confidence: 99%