2019 Compound Semiconductor Week (CSW) 2019
DOI: 10.1109/iciprm.2019.8819229
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Device characteristics and MIS interface evaluation of Al2O3/AlGaInN/AlGaN MIS HFET

Saki Saito
1
,
Daiki Hosomi
2
,
Keita Furuoka
3
et al.
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