2010
DOI: 10.1002/pssa.200925166
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Device characteristics and metal–dielectric high reflectivity coating analysis of λ ∼ 1.3 µm InGaAsP/InGaAsP MQW PBH lasers

Abstract: The cavity length‐dependent characteristics of compressively strained InGaAsP/InGaAsP multiple quantum well planar buried heterostructure lasers operating at λ ∼ 1.3 µm were investigated under continuous‐wave mode. The uncoated 600 µm long laser exhibits Pmax = 33.6 mW and Ith = 12.9 mA at 25 °C with dλ/dT = 0.35 nm/K and dλ/dPe = 0.044 nm/mW, leading to stable beam characteristics of 19.7° (parallel) × 24.1° (perpendicular). From the inverse slope efficiency versus cavity length plot, the loss parameters of i… Show more

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