2017
DOI: 10.1016/j.scriptamat.2016.12.029
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Development of unique cross-lamellar microstructure, resulting in the drastic increase in fracture toughness in Cr/Ir-codoped (Mo 0.85 Nb 0.15 )Si 2 crystals

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Cited by 5 publications
(7 citation statements)
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“…Figure 1(a–d) describe the crystal orientation maps of the precipitated C11 b phases analyzed by the electron backscatter diffraction in a scanning electron microscope (SEM-EBSD) in the annealed two-phase crystals 26 . The black parts and the colored grains represent the C40-matrix-phase and precipitated C11 b -phase grains, respectively.…”
Section: Resultsmentioning
confidence: 99%
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“…Figure 1(a–d) describe the crystal orientation maps of the precipitated C11 b phases analyzed by the electron backscatter diffraction in a scanning electron microscope (SEM-EBSD) in the annealed two-phase crystals 26 . The black parts and the colored grains represent the C40-matrix-phase and precipitated C11 b -phase grains, respectively.…”
Section: Resultsmentioning
confidence: 99%
“…As a result, three C11 b -phase variants - variant 1 (V1), variant 2 (V2), and variant 3 (V3) – produced from the C40 single crystals are denoted as follows:
Figure 1Microstructure variations depending on the added element. ( a – d ) Crystal orientation maps of the constituent C11 b phases in the FZ-grown crystals annealed at 1400 °C for 168 h examined by SEM-EBSD, according to the previous study 26 . ( a ) Nonadded (Mo 0.85 Nb 0.15 )Si 2 ternary crystal, ( b ) 1 at.% Cr-added crystal, ( c ) 1 at.% Ir-added crystal, ( d ) 0.5 at.% Cr and 0.5 at.% Ir-coadded crystals.
…”
Section: Resultsmentioning
confidence: 99%
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