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1991
DOI: 10.2172/5090643
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Development of ultra pure germanium epi layers for blocked impurity band far infrared detectors

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Cited by 3 publications
(2 citation statements)
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“…Residual dopants were found to be acceptors, leading to the choice of growing pure layers on Ga-doped substrates. The main problems encountered in CVD growth were gas phase nucleation and inhomogeneous growth [Rossington, 1988, Lutz, 1991. Structural defects in the epilayers contributed to deep acceptor levels ~ 5 x 10 16 cm -3 .…”
Section: Previous Growth Efforts and Motivation For Lpementioning
confidence: 99%
“…Residual dopants were found to be acceptors, leading to the choice of growing pure layers on Ga-doped substrates. The main problems encountered in CVD growth were gas phase nucleation and inhomogeneous growth [Rossington, 1988, Lutz, 1991. Structural defects in the epilayers contributed to deep acceptor levels ~ 5 x 10 16 cm -3 .…”
Section: Previous Growth Efforts and Motivation For Lpementioning
confidence: 99%
“…The higher temperatures required to crack GeCL precursors caused substrate dopant out-diffision which resulted in a dopant gradient at the episubstrate interface, where a sharp interface is preferred. Lutz (1991) showed that oxygen contamination occurs at the epi-substrate interface at a concentration of 10" ~m -~. All these attempts to fabricate BIB detectors were successhl to a degree, but still…”
Section: Review Of Past Ge Bib Detector-effortsmentioning
confidence: 99%