Development of the line-focus-beam ultrasonic material characterization system

Development of an improved calibration method for the LFB ultrasonic material characterization system

“…In actual measurements, the values of ∆z and α 0 depend on the system (mainly the LFB ultrasonic device) and ultrasonic frequency so that measured values of V LSAW and α LSAW obtained from (1) and (2) are different from the actual material values [13], [14]. We thus conduct the following system calibration according to the method proposed in the literature [13].…”

“…The two LFB-UMC systems used in this paper are called Systems A [2] and B [3]. Each system was installed in a temperature-controlled chamber that includes a mechanical system with ultrasonic device and specimens in order to maintain a stable measurement environment.…”

“…T he line-focus-beam ultrasonic material characterization (LFB-UMC) system, through V(z) curve analysis, can accurately measure the propagation characteristics of leaky surface acoustic waves (LSAWs), viz., phase velocity V LSAW and normalized attenuation factor α LSAW , that propagate on the water-specimen boundary, and thus quantitatively evaluate materials [1], [2]. We have improved this system, especially with regard to measurement of V LSAW , and achieved a measurement reproducibility of ±2σ = ±0.0013% at an arbitrary chosen point [3].…”

Evaluation of synthetic silica glasses by the ultrasonic microspectroscopy technology

“…LSAW velocities were measured by the line-focus-beam ultrasonic material characterization (LFB-UMC) system [4,5], and bulk-wave velocities were measured by the plane-wave UMC (PW-UMC) system [6,7]. Densities were measured by the Archimedes method [8].…”

Imaging techniques for mapping solution parameters, growth rate, and surface features during the growth of crystals from solution

“…[520]. Applications include the measurement of condensate film growth on a cooled metal surface [459], measurement of lubricant film thickness between two solid bodies [115], measurement of a thin-film layer on an anisotropic substrate by a phase-sensitive acoustic microscope [437], and the development of a line-focus-beam ultrasonic material characterization system for evaluating large diameter crystals and wafers [250]. The U.S. Patent Office website [528] lists 86 patents for this technique, several of which are applicable to crystal growth measurement.…”