Development of the LED measurement system of chromaticity coordinates correction

Chen, Nyen-Ts; Chen, Chih‐Wei

doi:10.1016/j.measurement.2012.07.008

Cited by 2 publications

(1 citation statement)

References 18 publications

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“…Zhou et al [10] presented an instrument, which can be used to inspect the quality of LED packaging, and it can simultaneously measure photometric, colorimetric and electrical parameters from the electroluminescence of the LEDs in a matter of millisecond. Chen et al [11] proposed a procedure to adjust the chromaticity coordinates by some engineering statistics methods, and they found that the average value of the color errors can be reduced by constructing an efficient and predictable calibration procedure.…”

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confidence: 99%

A Design for In-Situ Measurement of Optical Degradation of High Power Light-Emitting Diodes Under Accelerated Life Test

Chen,

Liu

et al. 2014

IEEE Trans. Device Mater. Relib.

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To better understand the reliability problem in highpower light-emitting diodes (LEDs), an online test is critical under an accelerated life test. In this paper, an experimental equipment was proposed for in situ measurement to evaluate the degradation of LED's optical properties. Signals such as illuminance and correlated color temperature were transmitted by the heat-resistant optical cable and were finally collected by detectors with high precision. The multichannel outputs were provided to simultaneously measure several samples. The measuring distance optimization was conducted by a ray tracing method, and the characteristics of optical output were listed. Accelerated life tests also indicate that the system error is less than 0.2%, and the measuring uncertainty of equipment can be controlled within 2%. A comparison experiment according to LM-80 measurement standard also shows a good agreement between the experimental data and the reference value.Index Terms-Light-emitting diodes, in situ measurement, accelerated life test.

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confidence: 99%