2012
DOI: 10.1016/j.nimb.2011.01.055
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Development of the Jyväskylä microbeam facility

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Cited by 3 publications
(2 citation statements)
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“…A typical TOF-ERDA set-up is described by Norarat et al [14]. Ions from accelerators with high terminal voltage are typically used, in particular heavy and multiply charged incident ions of Cl, Cu, Br or Au.…”
Section: Elastic Recoil Detection Analysismentioning
confidence: 99%
“…A typical TOF-ERDA set-up is described by Norarat et al [14]. Ions from accelerators with high terminal voltage are typically used, in particular heavy and multiply charged incident ions of Cl, Cu, Br or Au.…”
Section: Elastic Recoil Detection Analysismentioning
confidence: 99%
“…In the beginning of 2011 the accelerator was equipped with SNICS and Alphatross ion sources for production of negative ions from H − to Au − . The PIXE and lithography applications in addition to the planned microbeam imaging facility [2] would benefit significantly from increased H − beam brightness and better stability compared to the H − beams available from the Alphatross and SNICS ion sources. Therefore a project was started to develop PELLIS, the Pelletron Light Ion Source, an ion source dedicated for high-brightness H − beam production.…”
Section: H − Ion Source For Pelletron Acceleratormentioning
confidence: 99%