2012 IEEE Nuclear Science Symposium and Medical Imaging Conference Record (NSS/MIC) 2012
DOI: 10.1109/nssmic.2012.6551332
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Development of silicon strip sensors and radiation hardness studies for the PANDA MVD

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“…Figure 7: Left: photo of the 4" wafer with the full-size prototype sensors and the smaller structures. Right: corners of a prototype sensor [8].…”
Section: Double-sided Silicon Microstrip Sensorsmentioning
confidence: 99%
See 1 more Smart Citation
“…Figure 7: Left: photo of the 4" wafer with the full-size prototype sensors and the smaller structures. Right: corners of a prototype sensor [8].…”
Section: Double-sided Silicon Microstrip Sensorsmentioning
confidence: 99%
“…The use of the probe card allows to connect all the strips on both the front and the back side of the sensor, offering the possibility to perform a thorough characterization of the device under test; on the other hand, it is a destructive measurement since the sensor cannot be reused afterwards. Two full-size rectangular sensors were characterized with the probe station and with the probe card, respectively [6,8]. Additionally, a leakage current measurement was performed by the manufacturer on all delivered sensors; all the samples but two show a leakage current between 1 and 5 µA for a wide range of reverse bias voltages, as shown in figure 8.…”
Section: Pos(rd13)018mentioning
confidence: 99%