2016 IEEE 1st International Conference on Power Electronics, Intelligent Control and Energy Systems (ICPEICES) 2016
DOI: 10.1109/icpeices.2016.7853538
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Development of Radiation Hardened By Design (RHBD) of NAND gate to mitigate the effects of single event transients (SET)

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Cited by 3 publications
(4 citation statements)
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“…The model used for SEE simulations and widely accepted by the scientific community [ 29 , 30 , 31 ] is shown in Equation (6), where tinj is the injection instant, ta is the collection time constant of the junction, tb is the ion track establishment time constant, and Q is the critical charge. …”
Section: Simulations Resultsmentioning
confidence: 99%
“…The model used for SEE simulations and widely accepted by the scientific community [ 29 , 30 , 31 ] is shown in Equation (6), where tinj is the injection instant, ta is the collection time constant of the junction, tb is the ion track establishment time constant, and Q is the critical charge. …”
Section: Simulations Resultsmentioning
confidence: 99%
“…Although a technology computer-aided design considers all the phenomena produced by ionising particles with the p-n junction interaction, because the parameters strongly depend on the technology [21][22][23], the traditional double exponential law is used in simulation-before-test to model the shape of the transient current by using a double exponential current source in the design for the charge injection [24,25]. However, this model may not accurately represent certain SEEs [26,27], and for better results, this simulation can be performed with a dual double exponential current source, as reported in [28].…”
Section: Single-event Effectsmentioning
confidence: 99%
“…In [36,37], an LC-Tank-based VCO compliant with the SpaceFibre protocol for the space environment is designed. The diagnosis of radiation effects is performed by a simulation-before-test, and the charge injection, due to particle hitting, is implemented with the classical double exponential shape [21][22][23]. For charge injection simulations, two assumptions were made: only one ionising particle hit the circuit at a time, and the probability that two consecutive ionising particles hit the same node is equal to zero.…”
Section: Voltage-controlled Oscillatormentioning
confidence: 99%
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