“…Further examining thin films with 5 AgNW deposition cycles, as shown in Figure S3c, revealed that the dense AgNW network preserved the connectivity, even across cracks, suggesting that resistance changes were negligible despite repeated stretching. Our experimental results that the resistance of strain-sensors change nonlinearly are consistent with a general nanowire percolation network model, which follows the equation:: R / R 0 = (1 + ε) t . ,− Here, t is an exponent that characterizes the sensitivity of the resistance to the applied strain, dependent on the material properties and the geometry of the structure (related to the number of contact points and the density of deposited AgNWs). Electrical pathway connections are made where the AgNWs touch each other, and these contact points can remain connected even when deformed by stretching: As stretching increases, the number of contact points may decrease or the quality of these contacts may deteriorate, leading to increased resistance.…”