2010
DOI: 10.5188/ijsmer.17.182
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Development of New Micro Saw Wire Bonded with Diamond Grains Using Metal Solder

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Cited by 7 publications
(3 citation statements)
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“…The lateral pressure has a great influence on the finished surface roughness and processing defects such as micro-cracks. In addition, we can find in the experiment process that, under the experimental conditions, when the lateral pressure is higher than 10N, the wire saw bends seriously, surface roughness of workpiece rises sharply and the processing could hardly be conducted normally (Kamiya et al, 2010). Therefore, if an ultrasonic vibration saw is used for cutting, smaller lateral pressure shall be chosen to achieve low surface roughness and good processing quality.…”
Section: Influences Of Lateral Pressure On Surface Roughnessmentioning
confidence: 99%
“…The lateral pressure has a great influence on the finished surface roughness and processing defects such as micro-cracks. In addition, we can find in the experiment process that, under the experimental conditions, when the lateral pressure is higher than 10N, the wire saw bends seriously, surface roughness of workpiece rises sharply and the processing could hardly be conducted normally (Kamiya et al, 2010). Therefore, if an ultrasonic vibration saw is used for cutting, smaller lateral pressure shall be chosen to achieve low surface roughness and good processing quality.…”
Section: Influences Of Lateral Pressure On Surface Roughnessmentioning
confidence: 99%
“…Next, we investigated a method of producing a diamond saw-wire-fixed-grain using a metal solder in a vacuum chamber. Additionally, we developed a unique solder that contained a metallic compound [ 19 , 20 , 21 ]. Diamond grains could be bonded to the tungsten wires using this solder, which could be used for cutting extremely tough materials.…”
Section: Introductionmentioning
confidence: 99%
“…In recent years, multi-wire sawing has emerged as the mainstream slicing method for ingots with large diameter. In addition, new types of wire tools and slicing devices are being developed [2][3][4]. Currently, when several thin layers are sliced from an ingot using a multi-wire saw, the volume of kerf loss is same or more than the volume of the wafers [5].…”
Section: Introductionmentioning
confidence: 99%