2005
DOI: 10.1063/1.1896938
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Development of low noise cantilever deflection sensor for multienvironment frequency-modulation atomic force microscopy

Abstract: We have developed a low noise cantilever deflection sensor with a deflection noise density of 17fm∕Hz by optimizing the parameters used in optical beam deflection (OBD) method. Using this sensor, we have developed a multienvironment frequency-modulation atomic force microscope (FM-AFM) that can achieve true molecular resolution in various environments such as in moderate vacuum, air, and liquid. The low noise characteristic of the deflection sensor makes it possible to obtain a maximum frequency sensitivity li… Show more

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Cited by 354 publications
(355 citation statements)
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“…The AFM experiments were performed by a custom-built AFM head with an ultralow noise cantilever deflection sensor [3,29] and a photothermal excitation setup [30]. The AFM head was controlled with a commercially available AFM controller (ARC2: Asylum Research).…”
Section: Methodsmentioning
confidence: 99%
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“…The AFM experiments were performed by a custom-built AFM head with an ultralow noise cantilever deflection sensor [3,29] and a photothermal excitation setup [30]. The AFM head was controlled with a commercially available AFM controller (ARC2: Asylum Research).…”
Section: Methodsmentioning
confidence: 99%
“…Cantilever excitation methods To achieve the theoretically-limited performance given by equation (10), we should overcome two technical difficulties: the detection and excitation of the cantilever oscillation. So far, a number of detection techniques for a small cantilever have been reported [19,20,3,21,22,23]. In contrast, the excitation method for a small cantilever has yet to be established.…”
Section: Instability Of Cantilever Excitationmentioning
confidence: 99%
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