25th International Vacuum Nanoelectronics Conference 2012
DOI: 10.1109/ivnc.2012.6316901
|View full text |Cite
|
Sign up to set email alerts
|

Development of durable carbon field emission nanostructures for vacuum electronics

Abstract: The results achieved in improving the reliability and durability of cathodes based on field-induced electron emission of nano-scaled carbon structures are discussed. The features of the construction of two types of emitters: using carbon nanotubes (CNTs) and carbon-based planar-edge structures (CPES) -are described. The effective density of field emission current of 1.4 A·cm -2-and longevity of the emitter at least 2000 hours were achieved experimentally. Promising directions in the development of microwave de… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2

Citation Types

0
3
0

Year Published

2012
2012
2014
2014

Publication Types

Select...
2
1

Relationship

1
2

Authors

Journals

citations
Cited by 3 publications
(3 citation statements)
references
References 13 publications
0
3
0
Order By: Relevance
“…However, in [5] covered issues which, in our opinion, were beyond the scope of research studies [1][2][3][4]. It is a very important regularities of influence on the parameters the tunnel PE level of intense electrostatic fields with high strength, which are located on nanoscale inhomogeneities of the cathode surfaces.…”
Section: Theory Of Tunnel Photoeffectmentioning
confidence: 99%
See 1 more Smart Citation
“…However, in [5] covered issues which, in our opinion, were beyond the scope of research studies [1][2][3][4]. It is a very important regularities of influence on the parameters the tunnel PE level of intense electrostatic fields with high strength, which are located on nanoscale inhomogeneities of the cathode surfaces.…”
Section: Theory Of Tunnel Photoeffectmentioning
confidence: 99%
“…1 a [5,6], prompted the authors to submitting a new task. It was decided to use the structure with field localization to reduce the red tunnel photoeffect threshold [7,8].…”
Section: Theory Of Tunnel Photoeffectmentioning
confidence: 99%
“…In recent theoretical and experi mental investigations, satisfactory results on field elec tron emission were only obtained in the edge regions of CNT arrays [9]. The authors believe that the pros pects for the development of VCL lamps are related to the implementation of structures and the development of technologies for manufacturing cathodes of planar edge type [5,6,10] based on diamond like films. Standard equipment for 1.5 µm technology ensures the stability of processes involved in the formation of the topology of field emission structures, while also providing sufficient sensitivity to control parameters (e.g., for emitter edge formation with 20-30 nm pre cision).…”
mentioning
confidence: 99%