2002
DOI: 10.1007/3-540-45850-6_4
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Development of Cathodoluminescence (CL) for Semiconductor Research, Part I: TEM-CL Study of Microstructures and Defects in Semiconductor Epilayers

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Cited by 3 publications
(3 citation statements)
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“…TEM-CL uses an angstrom-size electron probe and provides CL spectra with both high energy and spatial resolution beyond the limits of conventional photoluminescence. [40] We used this capability to acquire CL data from individual, isolated core-shell fibers. STEM highangle annular dark field (HAADF) images were simultaneously acquired with CL data for reference.…”
Section: Characterizationmentioning
confidence: 99%
See 1 more Smart Citation
“…TEM-CL uses an angstrom-size electron probe and provides CL spectra with both high energy and spatial resolution beyond the limits of conventional photoluminescence. [40] We used this capability to acquire CL data from individual, isolated core-shell fibers. STEM highangle annular dark field (HAADF) images were simultaneously acquired with CL data for reference.…”
Section: Characterizationmentioning
confidence: 99%
“…However, the CL result indicates that the blue emission from UCNPs is present and could likely induce red emission from the core by the proposed 'handshake' process. Since the penetration depth of TEM-CL is greater than 20 μm [40], it is safe to assume that the CL is from the entire illuminated volume of the fiber (i.e. the volume inside the green box in Fig.…”
Section: Tem Imaging and Cathodoluminescent Activitymentioning
confidence: 99%
“…Conventionally CL imaging has been conducted with SEM, where the CL emission from specimens is collected through the parabolic mirror to generate a scanning image. Though CL images generated with TEM were once claimed (Yamamoto 2002;Strunk et al, 2006), what was actually done was a CL imaging with the scanning mode of STEM(STEM-CL). The type of CL imaging shown in this paper must be the first one ever reported.…”
Section: Introductionmentioning
confidence: 99%