High mobility is required to suppress free-carrier absorption in the near-infrared (NIR) region. Toward this end, we investigated the properties of a F-doped SnO2 (FTO) film deposited using low-pressure chemical vapor deposition (LPCVD) and found that the optimum deposition temperature varied with film thickness. On the basis of this result, we introduced a temperature gradient into LPCVD, which resulted in an improvement in the mobility of F-doped SnO2 on glass to 77.5 cm2 V-1 s-1.