1993
DOI: 10.1017/s0885715600017942
|View full text |Cite
|
Sign up to set email alerts
|

Development of an improved XRD sample holder

Abstract: A new and improved sample holder suited for small samples has been developed for X-ray diffractometry. This holder is made from a commercial semiconductor grade of silicon wafer grown and cut along the [100]-axis, i.e., Si(100). This new holder not only meets almost all basic requirements of an ideal holder, namely, flat and damage free surface, low background noise, few interference peaks, and desired shape with different cavity sizes, but also provides additional advantages for measuring crystallite sizes an… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1

Citation Types

0
3
0

Year Published

1998
1998
2013
2013

Publication Types

Select...
3
1

Relationship

0
4

Authors

Journals

citations
Cited by 4 publications
(3 citation statements)
references
References 2 publications
0
3
0
Order By: Relevance
“…All data were collected in the 2θ range of 3° to 70°, with a step scan of 0.02° and a counting time of 8 seconds per step. For each analysis, 10 mg of sample was powdered in alcohol and then mounted into the central hole (10 x 10 x 0.5 mm) of a nominally zero-background Si-sample holder (Li and Albe, 1993). The identification of crystalline phases for each pattern was performed by comparison…”
Section: Methods To Track Thermally-induced Chemical Changesmentioning
confidence: 99%
“…All data were collected in the 2θ range of 3° to 70°, with a step scan of 0.02° and a counting time of 8 seconds per step. For each analysis, 10 mg of sample was powdered in alcohol and then mounted into the central hole (10 x 10 x 0.5 mm) of a nominally zero-background Si-sample holder (Li and Albe, 1993). The identification of crystalline phases for each pattern was performed by comparison…”
Section: Methods To Track Thermally-induced Chemical Changesmentioning
confidence: 99%
“…The mixtures (1.5 to 2 mL) then were hardened at 60 to 90 ~ on 2 cm • 4 cm polished Si-metal wafers that had been cut perpendicular to (100) and glued to glass slides. The Si-substrates produce low-background XRD intensities (Li and Albe 1993), and the polished surface, together with the effects of the gel, help maximize preferred orientation of the crystals. It is evident from the XRD patterns that the illite crystals are highly oriented in the preparation, with their basal surfaces parallel to the surface of the slide, because no reflections with hk > 0 were observed, and because a small amount of clay (2.5 mg) often yielded large XRD intensities for 00l reflections.…”
Section: Methodsmentioning
confidence: 99%
“…The holders are constructed of very large single crystals of silicon or quartz that are cut in such a manner as to expose a chosen crystalline face (Li and Albe, 1993). The face that is chosen corresponds to a Bragg direction that has low or unobserved intensity for that crystal.…”
Section: Mounting the Powder Specimen In The X-ray Diffractometermentioning
confidence: 99%