2007
DOI: 10.1002/rcm.3139
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Development of a tabletop time‐of‐flight mass spectrometer with an ion attachment ionization technique

Abstract: We report a new type of mass spectrometry based on a time-of-flight mass spectrometer combined with an ion attachment ionization technique (IA-TOF). In contrast to electron ionization mass spectra, IA-TOF mass spectra are not complicated by peaks due to fragmentation of the molecular ion; the adduct ion formed in IA does not fragment. We developed a tabletop IA-TOF system and evaluated its performance by analyzing specimens originally in the gas, liquid, and solid phases. We obtained fragment-free spectra cove… Show more

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Cited by 16 publications
(9 citation statements)
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“…Initially, this method was created for the analysis of atoms and radicals from flames/plasma. Then, the instrument was developed to analyze organic compounds in the gas phase via metal ion attachment 20 . Alkali metal reagent ions formed complexes with analyte molecules in the ion source.…”
Section: Introductionmentioning
confidence: 99%
“…Initially, this method was created for the analysis of atoms and radicals from flames/plasma. Then, the instrument was developed to analyze organic compounds in the gas phase via metal ion attachment 20 . Alkali metal reagent ions formed complexes with analyte molecules in the ion source.…”
Section: Introductionmentioning
confidence: 99%
“…The secondary ions are transported to the TOF‐MS and then orthogonally accelerated by a pulsed electric field to obtain a mass spectrum. The TOF‐MS consists of a single‐stage accelerator, an electrostatic ion optics, a two‐stage reflectron, and an ion detector . Secondary ions entering to the accelerator are orthogonally accelerated with a fast‐rising high voltage pulse generator (6 kV, rise time 90 ns, repetition rate 400 Hz).…”
Section: Methodsmentioning
confidence: 99%
“…Secondary ions entering to the accelerator are orthogonally accelerated with a fast‐rising high voltage pulse generator (6 kV, rise time 90 ns, repetition rate 400 Hz). The ion optics, which consists of two sets of quadrupole lenses, aligns secondary ions nearly parallel to the axis of the TOF‐MS . Although secondary ions entering into the accelerator have different initial energies, the ion optics can accept energies up to about 300 eV.…”
Section: Methodsmentioning
confidence: 99%
“…The features that allow this system to detect the intermediate free radicals and novel molecular species produced in various plasmas have been extensively explored [3][4][5], and IAMS techniques can be used to identify and quantify compounds and mixtures under plasma [6,7] and pyrolysis [8,9] conditions. To extend the ion attachment technique to ion trap mass spectrometry [10] or time of flight mass spectrometry [11] has been realized.…”
Section: Introductionmentioning
confidence: 99%