Development of a tabletop time‐of‐flight mass spectrometer with an ion attachment ionization technique

Saito, Naoaki; Nanjyo, Jyun-ichi; Taneda, Yasuyuki; Shiokawa, Yoshiro; Tanimoto, Mitsumori

doi:10.1002/rcm.3139

Cited by 16 publications

(9 citation statements)

References 17 publications

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“…Initially, this method was created for the analysis of atoms and radicals from flames/plasma. Then, the instrument was developed to analyze organic compounds in the gas phase via metal ion attachment 20 . Alkali metal reagent ions formed complexes with analyte molecules in the ion source.…”

Section: Introductionmentioning

confidence: 99%

Ionization of organic molecules with metal ions formed in the laser plasma

et al. 2021

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A laser plasma ion source was used to ionize volatile organic compounds in a gas sample. The plasma was generated on a metal target in the intermediate vacuum region of ~0.3 Torr using a pulsed Nd:YAG laser with a wavelength of 1 μm. The resulting ions mass spectra were acquired using orthogonal time‐of‐flight mass spectrometer (O‐TOF MS). When using a copper target, the ions formed are simple complexes (CuM+) of copper ions with organic molecules. The possibility of online identification of trace amounts of alkanes in nitrogen and air, with a detection limit of ~10 ppb, was demonstrated. The ionization efficiency of volatile organic compounds through the formation of clusters with metal ions is 10−4 in terms of the quasimolecular complex ions. The rate constants of ion‐molecular reactions of copper ions with octane and water molecules in nitrogen and air are estimated.

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Section: Introductionmentioning

confidence: 99%

Ionization of organic molecules with metal ions formed in the laser plasma

et al. 2021

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“…The secondary ions are transported to the TOF‐MS and then orthogonally accelerated by a pulsed electric field to obtain a mass spectrum. The TOF‐MS consists of a single‐stage accelerator, an electrostatic ion optics, a two‐stage reflectron, and an ion detector . Secondary ions entering to the accelerator are orthogonally accelerated with a fast‐rising high voltage pulse generator (6 kV, rise time 90 ns, repetition rate 400 Hz).…”

Section: Methodsmentioning

confidence: 99%

“…Secondary ions entering to the accelerator are orthogonally accelerated with a fast‐rising high voltage pulse generator (6 kV, rise time 90 ns, repetition rate 400 Hz). The ion optics, which consists of two sets of quadrupole lenses, aligns secondary ions nearly parallel to the axis of the TOF‐MS . Although secondary ions entering into the accelerator have different initial energies, the ion optics can accept energies up to about 300 eV.…”

Section: Methodsmentioning

confidence: 99%

Time‐of‐flight secondary ion mass spectrometry (TOF‐SIMS) using an ionic‐liquid primary ion beam source

Fujiwara

Saito

2014

Surface & Interface Analysis

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An orthogonal acceleration time-of-flight secondary ion mass spectrometry (TOF-SIMS) system has been developed using a prototype vacuum-electrospay primary beam source that is capable of producing continuous ion beam of an ionic liquid. As a primary ion beam, an imidazolium ionic liquid, 1-ethyl-3-methylimidazolium bis(trifluoromethanesulfonyl) amide (EMI-TFSA), was electrosprayed at pressures around 2 × 10 À4 Pa and a flow rate of 50 nL/min. Using the TOF-SIMS system, three samples were analyzed: (i) EMI-TFSA, (ii) an ammonium ionic liquid, N,N-diethyl-N-methyl-N-(2-methoxyethyl)ammonium bis(trifluoromethanesulfonyl) amide (DEME-TFSA), and (iii) a polyethylene glycol (PEG300). Preliminary data showed that the vacuum electrospray of the ionic liquid was applicable to a primary ion beam source for SIMS. Nevertheless, irradiation of the ionic-liquid beam caused deposition as well as sputtering. The deposition would result from larger m/z components of ionic-liquid charged droplets. This is because projectile energy per nucleon of the larger m/z components seems too low to sputter materials. Because m/z values of charged droplets decrease with decreasing flow rate, it is required to reduce the flow rate of the ionic liquid so as to suppress the deposition of the ionic-liquid beam.

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“…The features that allow this system to detect the intermediate free radicals and novel molecular species produced in various plasmas have been extensively explored [3][4][5], and IAMS techniques can be used to identify and quantify compounds and mixtures under plasma [6,7] and pyrolysis [8,9] conditions. To extend the ion attachment technique to ion trap mass spectrometry [10] or time of flight mass spectrometry [11] has been realized.…”

Section: Introductionmentioning

confidence: 99%

Design and Performance of a Compact Li⁺ Ion Attachment Mass Spectrometry System with an Atmospheric Sampling Device

Takahashi

Nakamura

Fujii

2012

J. Am. Soc. Mass Spectrom.

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This report describes the development of a compact ion attachment mass spectrometry system. A single turbomolecular pump was employed to fill the basic requirements for vacuum conditions simply and cost-effectively, without the need for a differential pumping stage. A Li + ion source was placed in the first of two vacuum chambers; a 0.4 mm aperture allowed the product ions to enter the second chamber for mass analysis. With the present system, any chemical species, including radical intermediates, can be detected at atmospheric pressure in real-time. The minimum detectable amount (at S/N=3) of toluene was around 1.3×10 -12 g/s with a linearity greater than 10 4 . For illustrative purposes, we tested the system on laboratory air and on aroma compounds in the headspace of the Yuzu plant, Citrus junos.

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Development of a tabletop time‐of‐flight mass spectrometer with an ion attachment ionization technique

Cited by 16 publications

References 17 publications

Ionization of organic molecules with metal ions formed in the laser plasma

Ionization of organic molecules with metal ions formed in the laser plasma

Time‐of‐flight secondary ion mass spectrometry (TOF‐SIMS) using an ionic‐liquid primary ion beam source

Design and Performance of a Compact Li⁺ Ion Attachment Mass Spectrometry System with an Atmospheric Sampling Device

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Development of a tabletop time‐of‐flight mass spectrometer with an ion attachment ionization technique

Cited by 16 publications

References 17 publications

Ionization of organic molecules with metal ions formed in the laser plasma

Ionization of organic molecules with metal ions formed in the laser plasma

Time‐of‐flight secondary ion mass spectrometry (TOF‐SIMS) using an ionic‐liquid primary ion beam source

Design and Performance of a Compact Li+ Ion Attachment Mass Spectrometry System with an Atmospheric Sampling Device

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Design and Performance of a Compact Li⁺ Ion Attachment Mass Spectrometry System with an Atmospheric Sampling Device