1989
DOI: 10.1088/0022-3735/22/8/011
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Development of a piezotranslator-based bending device for in situ SEM investigations of high performance ceramics

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Cited by 12 publications
(4 citation statements)
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“…Wiklund et al [14], Frei et al [15], and Buchanan et al [16] already performed in-situ, 4-point bending tests in a scanning electron microscope (SEM), which enabled them to examine crack propagation phenomena at the microscopic level. For the here-presented bending setup, insitu SEM observation of pure bending failure is also an important requirement, as it will greatly enhance the possibilities to unravel the underlying physical origin of the bending failure.…”
Section: Design Considerations and Criteriamentioning
confidence: 99%
“…Wiklund et al [14], Frei et al [15], and Buchanan et al [16] already performed in-situ, 4-point bending tests in a scanning electron microscope (SEM), which enabled them to examine crack propagation phenomena at the microscopic level. For the here-presented bending setup, insitu SEM observation of pure bending failure is also an important requirement, as it will greatly enhance the possibilities to unravel the underlying physical origin of the bending failure.…”
Section: Design Considerations and Criteriamentioning
confidence: 99%
“…Kolluri et al [7] reports an example of the relevance of such an investigation with a miniaturized mixed-mode delamination setup, with which quantitative delamination characteristics can be measured while simultaneously the delamination mechanisms can be observed during real-time in situ SEM visualization. Wiklund et al [8], Frei et al [9] and Buchanan et al [10] already performed in situ bending tests in a SEM, relying on the four-point bending principle. Crack propagation due to bending was examined by all of them at the microscopic level.…”
Section: Requirements Of the Bending Testmentioning
confidence: 99%
“…The entire setup is positioned on top of another linear actuator to keep the region of interest in the field-of-view. The movement of this field-of-view stage represents the y-movement as described by equation (9). Figure 5 shows the implementation of the two …”
Section: Setup Kinematicsmentioning
confidence: 99%
“…In-situ SEM test techniques, which combine quantitative testing and high resolution imaging, extend the capability of SEM and open a new gate to the micro/nano-world. In the past three decades, there have been a lot of reports on the in-situ test techniques of SEM, such as tension/compression [1][2][3], micro/nano-indentation [4,5] and bending tests [6][7][8][9]. However, little was focused on the torsion test of micro-wires in SEM.…”
Section: Introductionmentioning
confidence: 99%