Advances in Metrology for X-Ray and EUV Optics VII 2017
DOI: 10.1117/12.2273029
|View full text |Cite
|
Sign up to set email alerts
|

Development of a high performance surface slope measuring system for two-dimensional mapping of x-ray optics

Abstract: The research and development work on the Advanced Light Source (ALS) upgrade to a diffraction limited storage ring light source, ALS-U, has brought to focus the need for near-perfect x-ray optics, capable of delivering light to experiments without significant degradation of brightness and coherence. The desired surface quality is characterized with residual (after subtraction of an ideal shape) surface slope and height errors of <50−100 nrad (rms) and <1−2 nm (rms), respectively. The ex-situ metrology that sup… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1
1

Citation Types

1
24
0

Year Published

2018
2018
2020
2020

Publication Types

Select...
3
3

Relationship

5
1

Authors

Journals

citations
Cited by 10 publications
(25 citation statements)
references
References 32 publications
1
24
0
Order By: Relevance
“…The accuracy of the measurement is estimated to be on the level of 60 nrad (RMS). For the surface slope metrology with the mirrors, we have used the DLTP [12][13][14] and verified the results via comparison with that of obtained with the new OSMS, [15][16][17] both available at the ALS XROL. The measurements suggest that the QERLIN SM1 and SM2 mirrors are fabricated with shapes significantly different from the ideal shapes (corresponding to the central values of the specified conjugate parameters) with the PV deviations of 31 µrad and 6.5 µrad, respectively.…”
Section: Discussionmentioning
confidence: 90%
See 2 more Smart Citations
“…The accuracy of the measurement is estimated to be on the level of 60 nrad (RMS). For the surface slope metrology with the mirrors, we have used the DLTP [12][13][14] and verified the results via comparison with that of obtained with the new OSMS, [15][16][17] both available at the ALS XROL. The measurements suggest that the QERLIN SM1 and SM2 mirrors are fabricated with shapes significantly different from the ideal shapes (corresponding to the central values of the specified conjugate parameters) with the PV deviations of 31 µrad and 6.5 µrad, respectively.…”
Section: Discussionmentioning
confidence: 90%
“…Because of the dramatic deviation of the slope profiles of SM1 and SM2 mirrors, as measured with the DLTP, from the ideal shapes corresponding to the central values of the specified conjugate parameters, we have also verified the DLTP results via comparison with the measurements with the new OSMS profiler, [15][16][17] also available at the ALS XROL. The NOM 28,29 -like gantry system of the OSMS is capable of twodimensional surface slope metrology over the spatial range from the sub-mm scale to the clear aperture.…”
Section: Tangential Slope Measurements With Sm2 Mirrormentioning
confidence: 87%
See 1 more Smart Citation
“…The developed approaches are rather universal and, therefore, widely applicable. Figure 1 shows the XROL OSMS experimental set-up [49,50] based on the multifunctional translation system, including 2D gantry and a custom tilt-flip-Z-translation stage (TFZS) and four electronic autocollimators ELCOMAT-3000 [53]. The AC in the surface-under-test (SUT) measuring (sample) channel, AC˗1, is placed vertically on the OSMS X-axis translation carriage.…”
Section: Introductionmentioning
confidence: 99%
“…[50]. [49,50] based on the multifunctional translation system, including 2D gantry and custom tilt-flip-Z-translation stage (TFZS), and four electronic autocollimators ELCOMAT-3000 [53], with a fixed distance AC-1 in the sample arm [38]. AC-2 monitors the X-axis carriage wobbling error.…”
Section: Introductionmentioning
confidence: 99%