Abstract:A new method has been developed to image surface contamination on-site by short range radiation emitters (such as alpha or beta particle emitters). The measurement is performed in direct contact with the contaminated surface and uses a solid scintillator coupled with Silicon Photomultiplier (SiPM) arrays. The signal readout is processed using a dedicated electronic.The experimental setup used to acquire the data, as well as the analysis procedure, are described and the results are discussed with regard to dism… Show more
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