Advances in Metrology for X-Ray and EUV Optics X 2023
DOI: 10.1117/12.2681814
|View full text |Cite
|
Sign up to set email alerts
|

Developing bendable air bearing slide supporting long trace profiler to compensate gravity effect during measuring process

Shang-Wei Lin,
Chao-Chih Chiu,
Chih-Yu Hua
et al.

Abstract: In Taiwan photon source facilities, soft x-ray beamlines are equipped with self-developed active high-precision mirrors or gratings. It is crucial to establish more advanced optical surface metrology instruments to satisfy the demands of optical production, installation, and testing in synchrotron optics. A long trace profiler (LTP) is an instrument used to measure the optical surface’s slope. This assists in monitoring the installation processes of optical instruments to ensure that the final optical componen… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

0
0
0

Publication Types

Select...

Relationship

0
0

Authors

Journals

citations
Cited by 0 publications
references
References 8 publications
(8 reference statements)
0
0
0
Order By: Relevance

No citations

Set email alert for when this publication receives citations?