Developing a Simple Scanning Probe System for Soft X-ray Spectroscopy with a Nano-focusing Mirror

Abstract

We developed a compact system for the spectroscopic mapping of a microstructure with a nano-focused beam at a soft X-ray beamline of synchrotron radiation. The experimental setup comprises a Wolter mirror and sample that are arranged with two mounting stages. The Wolter mirror is aligned with three degrees of freedom, and the sample with two degrees. The system generates a beam with an 800-nm spot and maps out a chemical distribution of non-uniform material through near-edge X-ray fine structure spectroscopy. The design and actual system are suited to experiments conducted with a nano-focused X-ray beam at beamlines of synchrotron radiation or an X-ray free-electron laser. Additionally, this technical note presents guidelines for actual experiments.

Resonant photoemission spectroscopy of atomic layer Fe2N on Cu(111) with continuous angular rotation of linearly polarized light

“…The technique can be used to a variety of materials not only at the surface [31] Large Large but also in the bulk form [32] where orbital characters are of interest. Since the technique allows an experimentalist to fix the sample position, it can be combined with a nano-focused beam and be applied to non-uniform systems [33]. Since the PS in the segmented cross undulator can be equipped with an electromagnetic coil, a rotation of the linear polarization can be made in principle at a frequency up to kHz [34][35][36].…”