Determining the chemical elements present in soybean leaves infected with Asian Soybean Rust employing X-ray fluorescence by SEM

Aragão, Patrícia Chaves de Oliveira; Andrade, Carlos Rogério; Spadotto, J.C.; Rodrigues, Aline

doi:10.1017/s1431927612009117

Microsc Microanal

2012

DOI: 10.1017/s1431927612009117

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Determining the chemical elements present in soybean leaves infected with Asian Soybean Rust employing X-ray fluorescence by SEM

Patrícia Chaves de Oliveira Aragão

Carlos Rogério Andrade

J.C. Spadotto

et al.

Abstract: Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

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Determining the chemical elements present in soybean leaves infected with Asian Soybean Rust employing X-ray fluorescence by SEM

Abstract: Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Cited by 0 publications

References 2 publications

No citations

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