2021
DOI: 10.1021/acsami.1c09750
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Determining Out-of-Plane Hole Mobility in CuSCN via the Time-of-Flight Technique To Elucidate Its Function in Perovskite Solar Cells

Abstract: Copper­(I) thiocyanate (CuSCN) is a stable, low-cost, solution-processable p-type inorganic semiconductor used in numerous optoelectronic applications. Here, for the first time, we employ the time-of-flight (ToF) technique to measure the out-of-plane hole mobility of CuSCN films, enabled by the deposition of 4 μm-thick films using aerosol-assisted chemical vapor deposition (AACVD). A hole mobility of ∼10–3 cm2/V s was measured with a weak electric field dependence of 0.005 cm/V1/2. Additionally, by measuring s… Show more

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Cited by 4 publications
(5 citation statements)
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“…The hole mobility (μ h ) was calculated in the SCLC regime as 1.74 (±0.61) × 10 –4 cm 2 V –1 s –1 . This value is lower than those reported by other measurement techniques such as field-effect mobility (0.1 cm 2 V –1 s –1 ) or time-of-flight (∼10 –3 cm 2 V –1 s –1 ) . However, SCLC mobility is more realistic for solar cell application since the film thickness is the same range as the solar cell (the time-of-flight technique uses films in μm thickness range) and the mobility is calculated across the thickness of the film (in contrast to field-effect mobility, where mobility is calculated in in-plane direction) .…”
Section: Resultsmentioning
confidence: 77%
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“…The hole mobility (μ h ) was calculated in the SCLC regime as 1.74 (±0.61) × 10 –4 cm 2 V –1 s –1 . This value is lower than those reported by other measurement techniques such as field-effect mobility (0.1 cm 2 V –1 s –1 ) or time-of-flight (∼10 –3 cm 2 V –1 s –1 ) . However, SCLC mobility is more realistic for solar cell application since the film thickness is the same range as the solar cell (the time-of-flight technique uses films in μm thickness range) and the mobility is calculated across the thickness of the film (in contrast to field-effect mobility, where mobility is calculated in in-plane direction) .…”
Section: Resultsmentioning
confidence: 77%
“…This value is lower than those reported by other measurement techniques such as field-effect mobility (0.1 cm 2 V –1 s –1 ) 12 or time-of-flight (∼10 –3 cm 2 V –1 s –1 ). 40 However, SCLC mobility is more realistic for solar cell application since the film thickness is the same range as the solar cell (the time-of-flight technique uses films in μm thickness range) and the mobility is calculated across the thickness of the film (in contrast to field-effect mobility, where mobility is calculated in in-plane direction). 40 To measure the conductivity and verify the nature of CuSCN/Au contact (ohmic or Schottky), a device with the structure FTO/Au/CuSCN/Au was prepared ( Figure 1 c).…”
Section: Resultsmentioning
confidence: 99%
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“…As it is difficult to identify the location of transit time ( t tr ) in the linear plot (Figure 2c inset), a logarithmic plot was used to identify t tr . The t tr value was obtained from the intersection of the linear regions [ 51 ] shown in Figure 2c. The results show that the carrier transit time in pure PET and KH556@PET films are 4.2 and 6.1 s, respectively, indicating that the latter contains more traps that impede carrier migration.…”
Section: Resultsmentioning
confidence: 99%
“…And the preparation of MoO 3 through energy-consuming vacuum evaporation certainly limits its use in the large-scale manufacturing. [16,17] In recent years, great effort has been devoted to developing new kinds of HTL materials, such as conjugated polyelectrolytes, [18][19][20] graphene oxides, [21][22][23][24][25] inorganic compounds, [26,27] self-assembled monolayer [28,29] and organic small molecules, [30,31] but most of these materials suffer from inferior charge transport property, poor film-forming ability and complicated preparation, limiting their further applications for anode modifications in OSCs. In particular, the use of inferior HTLs has been proved to cause serious problems of V oc loss, low fill factor (FF), and poor device stability, which severely degrades the OSC performances.…”
Section: Introductionmentioning
confidence: 99%