Determining micro droplet profiles using internal reflection interference fringe (RIF) technique

Kim, Iltai Isaac; Lie, Yang; Park, Jasesung; Kim, Hyun-Joong; Kim, Hong-Chul

doi:10.1364/fio.2023.jtu7a.2

Frontiers in Optics + Laser Science 2023 (FiO, LS) 2023

DOI: 10.1364/fio.2023.jtu7a.2

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Determining micro droplet profiles using internal reflection interference fringe (RIF) technique

Iltai Isaac Kim,

Yang Lie,

Jasesung Park

et al.

Abstract: Internal reflection interference fringe technique is developed to determine the micro/macro droplet profile, such as the droplet height, the contact angles, and the dual profiles, for which geometric modeling and ray-tracing schemes are developed to show an excellent agreement with the experiment.

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2024

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Investigating the origin of the far-field reflection interference fringe (RIF) of microdroplets

Kim,

Lie,

Park

et al. 2024

Journal of Applied Physics

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We show that the reflection interference fringe (RIF) is formed on a screen far away from the microdroplets placed on a prism-based substrate, which have low contact angles and thin droplet heights, caused by the dual convex–concave profile of the droplet, not a pure convex profile. The geometric formulation shows that the interference fringes are caused by the optical path difference when the reflected rays from the upper convex profile at the droplet–air interface interfere with reflection from the lower concave profile at oblique angles lower than the critical angle. Analytic solutions are obtained for the droplet height and the contact angle out of the fringe number and the fringe radius in RIF from the geometric formulation. Furthermore, the ray tracing simulation is conducted using the custom-designed code. The geometric formulation and the ray tracing show excellent agreement with the experimental observation in the relation between the droplet height and the fringe number and the relation between the contact angle and the fringe radius. This study is remarkable as the droplet's dual profile cannot be easily observed with the existing techniques. However, the RIF technique can effectively verify the existence of a dual profile of the microdroplets in a simple setup. In this work, the RIF technique is successfully developed as a new optical diagnostic technique to determine the microdroplet features, such as the dual profile, the height, the contact angle, the inflection point, and the precursor film thickness, by simply measuring the RIF patterns on the far-field screen.

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Investigating the origin of the far-field reflection interference fringe (RIF) of microdroplets

Kim,

Lie,

Park

et al. 2024

Journal of Applied Physics

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Determining micro droplet profiles using internal reflection interference fringe (RIF) technique

Cited by 1 publication

References 8 publications

Investigating the origin of the far-field reflection interference fringe (RIF) of microdroplets

Investigating the origin of the far-field reflection interference fringe (RIF) of microdroplets

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