2018
DOI: 10.1016/j.sab.2018.07.010
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Determination of uranium in immersion liquid of demolition waste using total reflection X-ray fluorescence analysis

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Cited by 13 publications
(10 citation statements)
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“…The peak widths, w = 0.313, 0.287, and 0.299 keV for the U Lα, Rb Kα, and Br Kβ peaks, respectively, were obtained by long‐duration measurements of standard solutions for each element, which were performed separately. As described in our previous study, the fixing of the peak width makes the fitting easy. Note that the relationship between w and the full width at half maximum (FWHM) of the peak is given as w=FWHM/2ln2.…”
Section: Resultsmentioning
confidence: 99%
“…The peak widths, w = 0.313, 0.287, and 0.299 keV for the U Lα, Rb Kα, and Br Kβ peaks, respectively, were obtained by long‐duration measurements of standard solutions for each element, which were performed separately. As described in our previous study, the fixing of the peak width makes the fitting easy. Note that the relationship between w and the full width at half maximum (FWHM) of the peak is given as w=FWHM/2ln2.…”
Section: Resultsmentioning
confidence: 99%
“…Because the energy of the U L III threshold (17.17 keV) is a little lower than that of the Mo Kα line, the intense Mo Kα line can efficiently excite uranium. Because the intensity of the In Kα peak, which was used as an internal standard in our previous studies, is thought to be low, gallium, which can be excited by the intense Mo Kα line, was employed as the internal standard in the present study. Unlike the portable TXRF device used in our previous studies, the glancing angle of an incident X‐ray to the sample is variable and set to 0.05°.…”
Section: Methodsmentioning
confidence: 99%
“…Because the intensity of the In Kα peak, which was used as an internal standard in our previous studies, is thought to be low, gallium, which can be excited by the intense Mo Kα line, was employed as the internal standard in the present study. Unlike the portable TXRF device used in our previous studies, the glancing angle of an incident X‐ray to the sample is variable and set to 0.05°. A 50‐mm 2 silicon drift detector with a resolution of 142.5 eV at 17.5 keV (Mo Kα) was placed just above the sample to efficiently observe X‐ray fluorescence.…”
Section: Methodsmentioning
confidence: 99%
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