2015
DOI: 10.1016/j.talanta.2014.08.026
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Determination of traces of As, B, Bi, Ga, Ge, P, Pb, Sb, Se, Si and Te in high-purity nickel using inductively coupled plasma-optical emission spectrometry (ICP-OES)

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Cited by 34 publications
(10 citation statements)
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“…The dissolved iron and sulfur were analyzed using inductively coupled plasma atomic emission spectroscopy (ICP-OES) 38, 39 after the samples were filtered with super membrane filters (0.2 µm pore size, Sigma-Aldrich, MO, USA). The product was determined by XRD and analyzed by MDI Jade 6 40 .…”
Section: Methodsmentioning
confidence: 99%
“…The dissolved iron and sulfur were analyzed using inductively coupled plasma atomic emission spectroscopy (ICP-OES) 38, 39 after the samples were filtered with super membrane filters (0.2 µm pore size, Sigma-Aldrich, MO, USA). The product was determined by XRD and analyzed by MDI Jade 6 40 .…”
Section: Methodsmentioning
confidence: 99%
“…After the sequential extraction, all the samples were filtered with super membrane filters (0.2 mm pore size, Sigma-Aldrich, MO, USA) and analysed using ICP-OES 67, 68 . The river water samples were analysed using ICP-OES directly after filtration with super membrane filters (0.2 μm pore size, Sigma-Aldrich).…”
Section: Methodsmentioning
confidence: 99%
“…The dissolved iron and sulfur were analyzed using ICP-OES after the samples were filtered with super membrane filters (0.2 µm pore size, Sigma-Aldrich, MO, USA) [5]. Filter residue was analyzed by X-ray diffraction (XRD) [6].…”
Section: Physicochemical Analysis Of the Samplesmentioning
confidence: 99%