1999
DOI: 10.1016/s0021-9673(99)00390-8
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Determination of trace anions in concentrated weak acids by ion chromatography

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Cited by 38 publications
(15 citation statements)
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“…Generally sample digestion using concentrated acids leads to the overloading of low-capacity IC columns and the low pH of the digest can cause disruption of the ion-exchange equilibrium. Nevertheless, Kaiser et al [11] described the determination of anions in concentrated weak acids (HF, etc.) by coupling an ion exclusion column (ICE) to an anion-exchange column.…”
Section: Introductionmentioning
confidence: 99%
“…Generally sample digestion using concentrated acids leads to the overloading of low-capacity IC columns and the low pH of the digest can cause disruption of the ion-exchange equilibrium. Nevertheless, Kaiser et al [11] described the determination of anions in concentrated weak acids (HF, etc.) by coupling an ion exclusion column (ICE) to an anion-exchange column.…”
Section: Introductionmentioning
confidence: 99%
“…The signal from a high concentration PO 4 3À will cover the peak or deform the peak shape of the target anion. [9][10][11] Furthermore, it will make the analytical column overloaded, which will shorten the service life of the column. Once the analytical column is overloaded, a ghost peak will appear, or the next injection may not even be allowed.…”
Section: Introductionmentioning
confidence: 99%
“…Liu, Kaiser, and Avdalovic 1999;Curran and Palmer 2001;Santoyo et al 2002;Peter and Chassaniol 2002;Lu et al 2002;Haddad 2004;Michalski 2006) and capillary electrophoresis (CE) (Jandik and Bonn 1993;Sádecká and Polonský 1999;Kaniansky et al 1999;Pacáková et al 2003;Galli et al 2003;Fukushi et al 1999). Several ion chromatography methods (Vanderford 1992;Dionex Corporation 1998;Kaiser, Rohrer, and Watanabe 1999;Wang et al 2002) have determined trace anions in hydrofluoric acid using a multidimensional suppressed approach that involves preconcentration of anions and separation from the matrix. A capillary zone electrophoresis method has been reported with an isotacophoresis initial step to determine anionic impurities on the silicon wafer surfaces treated with hydrofluoric acid vapor (Boden et al 1995).…”
Section: Introductionmentioning
confidence: 99%