1987
DOI: 10.1016/s0022-3093(87)80274-0
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Determination of the structure of GeO2-SiO2 glasses by EXAFS and X-ray scattering

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Cited by 18 publications
(21 citation statements)
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“…These structural parameters remain identical whatever the composition, and point out a slightly distorted GeO 4 tetrahedron, with a mean Ge-O bond length of 1.73 Å and a Debye-Waller factor of 0.051 Å at 12 K. The Ge-O distances are similar to those found in earlier studies [4,11].…”
Section: Low Temperature Ge K-edge Xas Spectrasupporting
confidence: 82%
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“…These structural parameters remain identical whatever the composition, and point out a slightly distorted GeO 4 tetrahedron, with a mean Ge-O bond length of 1.73 Å and a Debye-Waller factor of 0.051 Å at 12 K. The Ge-O distances are similar to those found in earlier studies [4,11].…”
Section: Low Temperature Ge K-edge Xas Spectrasupporting
confidence: 82%
“…Though the presence of Ge atoms is suspected to modify the atomic structure of silica and to cause both permanent and photo-induced variation of the refractive index, the microscopic origin of the original properties of germanosilicate optical fibers and glasses is still poorly constrained. An earlier EXAFS study of silica-rich compositions [4] has shown a local structure based on a continuous network of interconnected SiO 4 and GeO 4 tetrahedra. This model has been confirmed by molecular dynamics [5], although high energy X-ray diffraction measurements on a mixed glass with Si/Ge = 2.4 question the continuous nature of this random network [6].…”
Section: Introductionmentioning
confidence: 94%
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“…A more extensive study using a combination of Ge K-edge X-ray absorption and wide angle X-ray scattering (WAXS) experiments were carried out on GeO 2 − SiO 2 glasses containing 16 − 36 mol% GeO 2 [100]. They showed that the XANES spectra are similar with increasing GeO 2 content and that EXAFS-derived distances are 1.72 ± 0.02Å for Ge − O.…”
Section: Exafs and X-ray Scatteringmentioning
confidence: 99%
“…When germanium is introduced into the material, it substitutes randomly for silicon atoms in the SiO 2 network, with little germanium clustering, as has been demonstrated by EXAFS and X-ray scattering experiments [22]. The Raman spectra of Ge-doped silica have been studied before [22][23][24][25].…”
Section: Discussionmentioning
confidence: 99%