Abstract:We have performed a reliability analysis on Ni-Cd cells manufactured between 1964 and 1977 and aged by NASA ("CRANE") in simulated low earth and geosynchronous orbits. Similar cells are used in the construction of Ni-Cd batteries that serve as the energy storage medium in communications satellites. The statistical treatment of cell aging data conforms to techniques applied to semiconductor devices. In low earth orbit, the failure distribution by shorts is lognormal with standard deviation (s) of 1.06, median l… Show more
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