Determination of the orientation of a stacking fault by large-angle convergent-beam electron diffraction (LACBED)

Wei, Xiaoli; Duan, Xiaofeng; Wang, Shengqiang

doi:10.1016/s0304-3991(96)00079-4

Cited by 6 publications

(4 citation statements)

References 11 publications

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“…Fourier images were ''rediscovered'' and discussed in detail by Cowley and Moodie (1957). Duan (1996) showed that interference fringes in coherent CBED patterns could be understood as Fourier images in defocused CBED patterns.…”

Section: Interference Fringes In Coherentmentioning

confidence: 99%

“…For simplicity we consider Cs, the spherical aberration coefficient of the probe forming lens, is zero, and assume the illuminating aperture is infinite. At the back focal plane the wave function can be given as (Duan, 1996),…”

Section: Interference Fringes In Coherentmentioning

confidence: 99%

“…This method has been successfully used to determine the Burgers vector of dislocations in crystals (Tanaka, et al, 1991) and in quasicrystals (Feng and Wang, 1994;Wang and Dai, 1993). LACBED has been also utilized to determine the sense of the stacking fault (Tanaka et al, 1991;Wei et al, 1996;Xin and Duan, 1994).…”

Section: Measurement Of Strain Field By Cbedmentioning

confidence: 99%

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Applications of microdiffraction related to HREM

Zhu

Duan

et al. 1998

Microsc. Res. Tech.

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This paper deals with the coherent and the incoherent microdiffraction, as well as their applications, for example, determination of the nature of defects and boundaries, measurement of the strain field and identification of the symmetry, etc. The localized structure information obtained from microdiffraction has been compared with and complements that provided by HREM. Microsc. Res. Tech. 40:122–135, 1998. © 1998 Wiley‐Liss, Inc.

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Section: Interference Fringes In Coherentmentioning

confidence: 99%

Section: Interference Fringes In Coherentmentioning

confidence: 99%

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Applications of microdiffraction related to HREM

Zhu

Duan

et al. 1998

Microsc. Res. Tech.

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“…Carpenter & Spence (1982) calculated splitting of higher-order Lauezone lines caused by the presence of dislocation. Bird & Preston (1988), Lu et al (1990), Wang et al (1992) and Chou et al (1992) simulated the LACBED patterns for a crystal with a dislocation, while Wang et al (1992) and Wei et al (1996) simulated the LACBED patterns for a crystal with a stacking fault.…”

Section: Introductionmentioning

confidence: 99%

Elastic scattering of partially coherent beams of fast electrons by a crystal with a defect

Боргардт¹

1999

Acta Cryst Sect A

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Scattering of a quasi-monochromatic electron beam by a crystal with a defect is described with the use of the mutual coherency function and the formalism of quasiBloch waves. An expression correlating the mutual intensity on the exit and entrance surfaces of the crystal in terms of the scattering matrix has been found. The matrix elements are determined by a system of integrodifferential equations, which have been obtained without using the column approximation. It has been shown that calculations of the matrix elements can be signi®cantly simpli®ed when the approximation of the small-angle scattering of quasi-Bloch waves by the defect displacement ®eld is satis®ed. Such an approximation can be applied in many cases, e.g. to a crystal with a dislocation. The mutual intensity on the crystal entrance surface has been found for the general case of defocused illumination. As an example of applying the new approach, expressions for the intensity in convergent-beam electron diffraction (CBED) and large-angle CBED (LACBED) patterns have been obtained. The LACBED patterns of a crystal with a dislocation have been simulated. It has been shown that the developed approach allows a more exact simulation of the LACBED than do the conventional approaches using the column approximation and the approximation of independent plane waves ®lling the illumination cone.

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