Determination of the optic tensor profile in a FLC layer by the propagation of optic modes

Ellipsometric depth profiling of the refractive index: a neural network method and its application to a surface-induced inhomogeneity in a liquid crystal

“…Although we have focused here on a rather specialized experimental application of ellipsometric depth profiling, it is clear that the strategy followed can easily be adopted for refractive-index depth profiling from the nanometre to the micrometre range in technologically important cases such as ion-implanted silicon, surface oxidization and coated glass. The presented method can also help to resolve some issues in ferroelectric liquid crystal [12,13] and waveguide [30,31] applications.…”

“…δ N,i = 2π dn N,i /(λ cos θ N,i ) (10) for the N-polarized component and υ P ,i = n P ,i / cos θ P ,i (11) δ P ,i = 2π dn P ,i /(λ cos θ P ,i ) (12) for the P-polarized component. The electric fields at the first and last interface are then coupled by where the components of the matrix M take different values for the two polarizations and the signs refer to the incoming (+) or outgoing (−) part of the wave.…”

“…Ellipsometry, the analysis of the polarization after reflection or transmission of light, is an important tool for depth profiling of the refractive index of optically inhomogeneous materials. Applications based on the retrieval of optical material properties from ellipsometric data are abundant in many fields of research [1][2][3][4][5][6][7][8][9][10][11][12][13][14][15][16][17]. In semiconductor technology, for example, it is important to estimate the depth profile of the structural damage or concentration of impurities caused by ion implantation, oxidization or chemical treatment.…”

Optical probing of thin liquid crystal layers using the prism-coupling technique

“…Comparing data at different applied voltages reveals that all mode positions are no longer coincident with their zero voltage counterparts. Comparison of theory with experiment indicated there is a region of liquid crystal in the middle of the cell largely undistorted under an applied electric field consistent with the retention of the chevron structure [16], It is necessary that a singular point exists for the continuity of the director field in the centre of the cell giving rise to a chevron interface.…”