Determination of the magnetic contribution to the YFe2 susceptibility by means of X-ray resonant magnetic reflectivity

Interference phenomena of synchrotron radiation in TEY spectra for silicon-on-insulator structure

“…More accurate determination of the optical constants for the layers can be obtained by measurements of the angular dependencies of the reflectivity and TEY for different energies, as was carried out by, for example, Gupta et al (2007) and Smekhova et al (2010). Unfortunately we had no such experimental data; for soft X-rays such data can only be obtained at specialized synchrotron radiation beamlines.…”

Reflectivity spectra as absorption resonant spectra: is it correct?

“…In many cases, e.g. for investigations of thin resonant layers or surfaces, the Mo ¨ssbauer or X-ray resonant spectra near the absorption edges are measured in reflection geometry at small grazing angles, or some larger glancing angles in the case of the soft X-ray region (Martens & Rabe, 1980;Greaves, 1990;Waki & Hirai, 1989;Andreeva et al, 1991Andreeva et al, , 2018Irkaev et al, 1993a;Isaenko et al, 1994;Kao et al, 1994;Filatova et al, 1995Filatova et al, , 2006Sacchi & Mirone, 1998;Neumann et al, 1998;Se `ve et al, 1999;Oppeneer et al, 2003;Bergmann et al, 2006;Goering et ISSN 1600-5767 al., 2010Smekhova et al, 2010;Domashevskaya et al, 2011;Mitsui et al, 2012aMitsui et al, , 2016Mitsui et al, , 2020Ro ¨hlsberger et al, 2012;Holldack et al, 2014;Haber et al, 2016Haber et al, , 2017Cini et al, 2018Cini et al, , 2020Majhi et al, 2018;Cucinotta et al, 2020;Engel et al, 2020;Okabayashi et al, 2021a;Yokota et al, 2021;Ogawa et al, 2022). These experiments were carried out at synchrotron stations, which supply investigators with angular collimated and energy-selective radiation.…”