Determination of the linear attenuation range of electron transmission through film specimens

Fang, Wanliang; Zhang, Haibo; Cao, Meng; Nishi, Ryuji; Takaoka, Akio

doi:10.1016/j.micron.2010.05.014

Cited by 13 publications

(5 citation statements)

References 33 publications

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“…This difference between the two tomography results indicates the effect of inelastically scattered electrons with increasing sample proportion in the 1.0‐µm‐thick section. Similarly, increasing the electron beam path length at higher tilt angles also leads to image degradation due to multiple scattering (Wang et al ., 2010a, b, c). In addition to these factors, the depth of focus must be considered when observing thick sections at magnifications above 10 000× (Hayashida & Malac, 2016).…”

Section: Discussionmentioning

confidence: 99%

Application of ultra‐high voltage electron microscope tomography to 3D imaging of microtubules in neurites of cultured PC12 cells

Nishida¹,

Yoshimura

Nishi

et al. 2020

Journal of Microscopy

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Summary Electron tomography methods using the conventional transmission electron microscope have been widely used to investigate the three‐dimensional distribution patterns of various cellular structures including microtubules in neurites. Because the penetrating power of electrons depends on the section thickness and accelerating voltage, conventional TEM, having acceleration voltages up to 200 kV, is limited to sample thicknesses of 0.2 µm or less. In this paper, we show that the ultra‐high voltage electron microscope (UHVEM), employing acceleration voltages of higher than 1000 kV (1 MV), allowed distinct reconstruction of the three‐dimensional array of microtubules in a 0.7‐µm‐thick neurite section. The detailed structure of microtubules was more clearly reconstructed from a 0.7‐µm‐thick section at an accelerating voltage of 1 MV compared with a 1.0 µm section at 2 MV. Furthermore, the entire distribution of each microtubule in a neurite could be reconstructed from serial‐section UHVEM tomography. Application of optimised UHVEM tomography will provide new insights, bridging the gap between the structure and function of widely‐distributed cellular organelles such as microtubules for neurite outgrowth. Lay Description An optimal 3D visualisation of microtubule cytoskeleton using ultra‐high voltage electron microscopy tomography The ultra‐high voltage electron microscope (UHVEM) is able to visualise a micrometre‐thick specimen at nanoscale spatial resolution because of the high‐energy electron beam penetrating such a specimen. In this study, we determined the optimal conditions necessary for microtubule cytoskeleton imaging within 0.7‐µm‐thick section using a combination with UHVEM and electron tomography method. Our approach provides excellent 3D information about the complex arrangement of the individual microtubule filaments that make up the microtubule network.

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Section: Discussionmentioning

confidence: 99%

Application of ultra‐high voltage electron microscope tomography to 3D imaging of microtubules in neurites of cultured PC12 cells

Nishida¹,

Yoshimura

Nishi

et al. 2020

Journal of Microscopy

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“…Contrast is caused by differences in diffraction, phase, thickness and mass. By blocking diffracted beams with an aperture in the back focal plane a bright field (BF) image is obtained and this increases the diffraction contrast, because diffracted areas then appear darker [68]. A BF micrograph is shown in Figure 4.3.…”

Section: Transmission Electron Microscopymentioning

confidence: 99%

Theoretical and experimental studies of ternary and quaternary nitrides for machining and thermoelectric materials

Pilemalm

2019

Linköping Studies in Science and Technology. Dissertations

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Nitrides are used as coatings and thin films for a wide range of applications. The study and use of nitrides in the recent decades have shifted towards ternary, quaternary or even higher order (complex) nitrides. There is an interest to use ternary and quaternary nitrides for machining and thermoelectric materials, because it gives the possibility to choose composition and thereby design the materials properties. This thesis presents research results on TiAlN and and TiAlN-based coatings that are used as hard coatings for machining and on ternary scandium nitrides that are of interest for thin films for thermoelectric applications. The high-pressure high-temperature behavior of cubic TiAlN deposited on cubic boron nitride has been experimentally studied. It has been shown that the spinodal decomposition, which means decomposition into cubic domains enriched in TiN and AlN, is delayed as a result of high pressure compared to ambient pressure. No chemical interaction between coating and substrate occurs. TiZrAlN has been theoretically and experimentally studied at high temperature. The results show that the when Zr-content is decreased and the Al-content is increased the decomposition route changes from nucleation and growth to spinodal decomposition. The microstructure evolution with temperature depends on the initial composition. In the case where the decompositon starts with only spinodal decomposition the microstructure at 1100°C consists of domains that are larger than in the case where the decomposition occurs by nucleation and growth. ScMN 2 (M=V, Nb, Ta) phases have been experimentally demonstrated for M=Nb and Ta in a few studies, but have not been much investigated. In this theseis, their crystal structure, stability, elastic properties, electronic structure and thermoelectric properties have been studied. At 0 K and 0 GPa it has been shown that these three phases are thermodynamically and elastically stable. Additionally, these are narrow-bandgap semiconductors and their thermoelectric properties can be tuned by doping. Pressure has a stabilizing effect on these structures. When pressure increases from 0-150 GPa the elastic constants and moduli increases in the range 53-317 %. v vi Preface This thesis is the result of my work as a Ph.D. student at the Department of Physics, Chemistry and Biology (IFM) of Linköping University in Sweden. During my studies it was unfortunely discovered that I since childhood or even birth suffered from a brain tumor (Gangliocytoma). Because of this sick leave the studies are divided into two periods. From January 2011 to November 2014, I worked in the Nanostructured Materials Division and from October 2017 to April 2019 I worked in the Thin Film Physics Division. On 5th June 2015 I woke up after brain surgery and my tumor had been successfully removed. This made me more motivated to focus on finalizing this thesis after the break in the studies. Furthermore, this thesis is based on and extended from my Licentiate thesis TiAlN-based Coatings at High Pressures and Temperature...

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“…One of the major challenges in the application of EELS in transmission in solid-state physics and material science is the preparation of the samples. The mean free path of electrons in solids is limited due to a number of interactions, predominantly plasmon excitations [7,[42][43][44][45].…”

Section: Sample Preparationmentioning

confidence: 99%

Electron energy-loss spectroscopy: A versatile tool for the investigations of plasmonic excitations

Roth

König

Fink

et al. 2014

Journal of Electron Spectroscopy and Related Phenomena

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The inelastic scattering of electrons is one route to study the vibrational and electronic properties of materials. Such experiments, also called electron energy-loss spectroscopy, are particularly useful for the investigation of the collective excitations in metals, the charge carrier plasmons. These plasmons are characterized by a specific dispersion (energy-momentum relationship), which contains information on the sometimes complex nature of the conduction electrons in topical materials. In this review we highlight the improvements of the electron energy-loss spectrometer in the last years, summarize current possibilities with this technique, and give examples where the investigation of the plasmon dispersion allows insight into the interplay of the conduction electrons with other degrees of freedom.

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Determination of the linear attenuation range of electron transmission through film specimens

Cited by 13 publications

References 33 publications

Application of ultra‐high voltage electron microscope tomography to 3D imaging of microtubules in neurites of cultured PC12 cells

Application of ultra‐high voltage electron microscope tomography to 3D imaging of microtubules in neurites of cultured PC12 cells

Theoretical and experimental studies of ternary and quaternary nitrides for machining and thermoelectric materials

Electron energy-loss spectroscopy: A versatile tool for the investigations of plasmonic excitations

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