2012
DOI: 10.1134/s1063782612040240
|View full text |Cite
|
Sign up to set email alerts
|

Determination of the degree of ordering of materials’ structure by calculating the information-correlation characteristics

Abstract: A new method for the analysis of self organization processes in solid state materials by calculating the information-correlation characteristics of a surface (in particular, by calculating the average mutual information) is described. Criteria for determining the degree of ordering of a surface structure are suggested; these criteria have been tested for experimental semiconductor structures of single , poly crystalline, and amorphous silicon. The dependences of the information characteristics for films of dis… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1
1

Citation Types

0
6
0

Year Published

2015
2015
2022
2022

Publication Types

Select...
5
2

Relationship

0
7

Authors

Journals

citations
Cited by 8 publications
(6 citation statements)
references
References 2 publications
(4 reference statements)
0
6
0
Order By: Relevance
“…According to the work (Lu et al, 2012) the various time-temperature modes of IR-annealing and the modifying additive concentration are the technological parameters that form the unique structure of a polymer composite Ag-containing PAN film and lead to essential change of the film surface morphology. It have been established that the best gas-sensitivity shows the films with obvious self-organization processes and presence of structures with several correlation dimensions and high value of average mutual information (Vikhrov et al, 2012) or mean reciprocal information (Mursalov et al, 2000).…”
Section: Discussionmentioning
confidence: 99%
See 3 more Smart Citations
“…According to the work (Lu et al, 2012) the various time-temperature modes of IR-annealing and the modifying additive concentration are the technological parameters that form the unique structure of a polymer composite Ag-containing PAN film and lead to essential change of the film surface morphology. It have been established that the best gas-sensitivity shows the films with obvious self-organization processes and presence of structures with several correlation dimensions and high value of average mutual information (Vikhrov et al, 2012) or mean reciprocal information (Mursalov et al, 2000).…”
Section: Discussionmentioning
confidence: 99%
“…The film surface images received by means of microscopy can serve as a starting point for the analysis by methods of nonlinear dynamics and the information theory (Vikhrov et al, 2005, Bodyagin et al, 1997, Mursalov et al, 2000, Vikhrov et al, 2012, Avacheva et al, 2008. The processes in solid-state formation are characterized by the basic features of self-organizing systems (Vikhrov et al, 2005).…”
Section: Introductionmentioning
confidence: 99%
See 2 more Smart Citations
“…In some cases for disordered materials, there is not any correlation vector at all. In this case, the surface structure should be evaluated by the degree of ordering [6].…”
Section: Methods For Investigating Structural Features In Solid-state...mentioning
confidence: 99%