2015
DOI: 10.1016/j.jallcom.2015.04.205
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Determination of the atomic width of an APB in ordered CoPt using quantified HAADF-STEM

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Cited by 16 publications
(12 citation statements)
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“…This value is within reason compared with reported  values in different ordered alloy systems [29][30][31].…”
Section: Refinement Of Crystal Structure Of η'' Phase With Finite Antiphase Boundary Width Modelsupporting
confidence: 87%
“…This value is within reason compared with reported  values in different ordered alloy systems [29][30][31].…”
Section: Refinement Of Crystal Structure Of η'' Phase With Finite Antiphase Boundary Width Modelsupporting
confidence: 87%
“…Moreover, by applying the quantitative HAADF (qHAADF) image analysis algorithm, developed by Molina et al [17], it is possible to correlate effectively HAADF intensity and atomic column composition in III–V ternary semiconductor materials [12, 16, 18] and consequently in GaAsBi compounds. Additionally, high-resolution HAADF-STEM images offer information about crystalline quality [1922]. …”
Section: Introductionmentioning
confidence: 99%
“…Quantitative STEM has been used to achieve atom counting in the beam direction, [14] location of individual dopant atoms in three-dimensions, [15,16] and characterization of chemical ordering on the atomic-scale. [17][18][19][20] All of these methods have relied on the intensity of atomic columns in high-angle annular dark field (HAADF) STEM images. In this letter, we will show that additional parameters, including specimen thickness and atomic-scale compositional analysis are necessary in combination with simulations to characterize atomic-scale ordering along the path of the electron beam.…”
mentioning
confidence: 99%