Determination of refractive index, thickness, and the optical losses of thin films from prism-film coupling measurements

Abstract

To cite this version:Julien Cardin, Dominique Leduc. Determination of refractive index, thickness, and the optical losses of thin films from prism-film coupling measurements. Applied optics, Optical Society of America, 2008, 47 (7) We present a method of analysis of prism-film coupler spectroscopy based on the use of transfer matrix and genetic algorithm, which allows the simultaneous determination of refractive index, thickness, and optical losses of the measured layer.

Measurement of the refractive index of electrically poled soda-lime glass layers using leaky modes

“…Reflectivity measurements have been used to analyse other material systems including ion implanted insulators and deposited layers [28,29,31]. The interpretation of reflectivity spectra can be done in a number of ways depending on the level of sophistication of the index model used.…”

“…This is necessary if the poled glass layer is thin and supports only a few or even just one leaky mode. A number of matrix methods have been published in the literature that can calculate the reflectivity spectra [28,29,31,33]. The theoretical reflectivity spectra R(θ) is calculated using a standard matrix method [33] whereby the glass is divided into a large number N of layers of constant refractive index that are lossless.…”

“…(7) where Tap(θ) and Tpa(θ) are the air to prism and prism to air transmittivity and H(θ) is the instrumentational transfer function [31]. Without the sample pressed against the prism R(θ)=1 so the measured reflection coefficient for this experimental situation is (7) and (8), R(θ) can be determined from experimental data by taking the ratio…”

Measurement of planar refractive index profiles with rapid variations in glass using interferometry and total variation regularized differentiation

“…These include ellipsometry using multiple angle data [1], mode measurements mediated with a prism coupler (for both guided and leaky modes) [2][3][4], reflectance analysis [5,6] and numerous interferometric methods [7][8][9][10][11][12][13]. Each method has advantages and disadvantages.…”

“…They are, however, only applicable to index profiles that are planar. If the sample supports both guided and leaky modes, then the mode measurement method relies on having a model for the index profile whose parameters require adjustment to fit the experimental data [2,3]. Hence, some a priori knowledge of the index profile is required.…”