Determination of Refractive Index and Material Dispersion of Step Index Optical Fibers Using Variable Wavelength Interferometric Technique

Abstract

The variable wavelength interferometric technique is used to determine the refractive index and material dispersion of [Ge-B doped SiO2] step index optical fiber. The modified Pluta polarizing interference microscope is used to measure the dispersion curve of a step index optical fiber, which is important in understanding, the loss mechanisms in optical fibers. Microinterferograms are given for illustration.