2007
DOI: 10.1016/j.sna.2006.10.002
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Determination of piezoelectric coefficients and elastic constant of thin films by laser scanning vibrometry techniques

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Cited by 26 publications
(14 citation statements)
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“…Resulting d 33 values are normally lower than in the corresponding bulk 12. Furthermore, effective d 33 values are dependent on the extent of the substrate rigidity 25–27…”
Section: Methodsmentioning
confidence: 96%
“…Resulting d 33 values are normally lower than in the corresponding bulk 12. Furthermore, effective d 33 values are dependent on the extent of the substrate rigidity 25–27…”
Section: Methodsmentioning
confidence: 96%
“…Working with these structures, the properties of the piezoelectric materials were determined by analyzing static deformations [6] to [8] and resonance frequency shifts [7] and [9]. Dynamic responses were also used to characterize piezoelectric materials, often at very low frequencies to avoid large amplitude oscillations associated with resonance and the potential nonlinear behavior which may result [9] to [12].…”
Section: Introductionmentioning
confidence: 99%
“…Displacement distribution of the structured surface ( Fig. 1) along the centreline of the free and clamped actuators was measured in a ±0.5 V/µm electric field at 10 Hz frequency using a fibre-optic laser vibrometer OFV-5000 (Polytec GmbH, Germany) and XY-table [16,17]. Additionally, displacement at the centre of the free gradient actuators was measured from ±0.1 V/µm to ±0.5 V/µm electric fields at 10 Hz frequency under applied weights up to 18.8 g. Stiffness of a PZT 5H bulk disc and micromachined actuators was measured utilising the measurement system presented by Juuti et al [15].…”
Section: Methodsmentioning
confidence: 99%