2012
DOI: 10.1134/s1061933x12060051
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Determination of nanoparticle sizes by X-ray diffraction

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Cited by 152 publications
(60 citation statements)
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“…3) 14 . The relative phase composition of rutile in n-TiO 2 was found to be 66% which was calculated using Spurr and Myers formula 15 .…”
Section: Resultsmentioning
confidence: 99%
“…3) 14 . The relative phase composition of rutile in n-TiO 2 was found to be 66% which was calculated using Spurr and Myers formula 15 .…”
Section: Resultsmentioning
confidence: 99%
“…This type of analysis is based on the diffraction line profile, where the Scherrer 21 method is the most used for its simplicity, which may lead to results with little accuracy associated with the complexity of the diffraction pattern. However, exist more efficient methodologies for this calculation such as the Warren-Averbach modified method 21 . Given the complexity of determining the sample crystal phase of XRD spectrum, this calculation was not performed in our study.…”
Section: Resultsmentioning
confidence: 99%
“…The properties of polycrystalline materials depend, among other things, on the crystallite size. In the case of nanoparticles, the crystallite size is associate with the average nanoparticle size [29]. The Scherrer equation [30] was used to determine the average crystalline domain size of the bimetallic nanoparticles using the (111) diffraction peak of the XRD profile, leading to an average size of 8 nm.…”
Section: Resultsmentioning
confidence: 99%