Ace urate axial ratios of anisotropic crystalline phases can be obtained from precision powder data by computing exhaustively the axial ratios from pairs of closely spaced, non-overlapping reflections. The method has been applied successfully to the tetragonal, hexagonal, orthorhombic, and monoclinic systems.The determination of axial ratios with the reflecting goniometer was developed into a precise technique by mineralogists of the nineteenth century. Compendia such as Dana's System of Mineralogy or Groth's Chemische Krystallographie are replete with this type of morphological information which has been of A C 17 --59 908 AXIAL RATIOS FROM POWDER DIFFRACTION PATTERNS immense value to X-ray crystallographers. During the past three decades, mineralogists have shifted from the determination of axial ratios by optical goniometry to the determination of unit-cell dimensions by X-ray diffraction. Single-crystal methods, in general, have proved vastly superior to the powder methods in establishing the correct unit cell of a crystalline phase. However, in many cases, the accuracy of these cell constants is not sufficiently high to yield axial ratios comparable in accuracy to those determined by the two-circle goniometer. The reason for this limited accuracy can be attributed largely to the general use of small-radius cameras for rotation or Weissenberg photographs. Modern powder methods, on the other hand, are capable of yielding axial ratios of greater accuracy than those obtained by the best morphological measurements (Frondel, 1962). There is an abundance of published data on precision measurements of lattice parameters of polycrystalline phases (Klug& Alexander, 1954;Edmunds, Lipson & Steeple, 1955;Azaroff & Buerger, 1957; Parrish & Wilson, 1959; I.U.Cr. Stockholm meeting, 1959); unfortunately, however, the substances investigated pertain to relatively simple structures for which unequivocally indexed back-reflections can be registered. For anisotropic substances with cell dimensions exceeding 6 ~, it is rather unusual to observe in the back-reflection region unambiguous pinacoid reflections of sufficient intensity for the reliable determination of lattice parameters. To circumvent this limitation of the powder method it has been found advantageous to compute exhaustively the axial ratios from pairs of closely spaced, nonoverlapping reflections.
TheoryThe ratio of two interplanar spacings, dm=d (hmkmlm) and dn = d(hnlcnln), can be determined with a minimum error when these spacings form a clearly resolved 'doublet' because as 0n approaches 0~ (without overlapping) the principal systematic errors cancel out; e.g. film shrinkage, effective camera radius, absorption correction, beam divergence, and refraction correction at low 0. For an orthorhombic crystal, the square of this ratio is given by the expression where rl =a/b, re = c/b, the cell edges follow the convention 0 < c < a