Determination of interfacial residual stress field in an Al–Al2O3 composite using convergent-beam electron diffraction technique

Differential-aperture X-ray structural microscopy: a submicron-resolution three-dimensional probe of local microstructure and strain

“…For instance, powerful transmission electron microscopies (TEM) exist for the identification of new phases in very small volumes, observation of deformation microstructure (and even core structures of defects), chemical bonding measurements using selected area diffraction (Shechtman et al, 1984;Yang et al, 1996), diffraction contrast interpolation (Hirsch et al, 1977;, convergent beam electron diffraction (CBED) (Tanaka et al, 1988;Zou et al, 1998;Wang, 2000), high resolution electron microscopy (Yan et al, 1998), and electron energy loss spectroscopy (EELS) (Egerton, 1996) techniques. Scanning electron microscopy (SEM) probes equipped with electron backscattering diffraction (EBSD) (Adams et al, 1993;Field, 1997) and atomic force microscopy (AFM) (Gerberich et al, 1998) capabilities are well developed techniques for the study of the surface microstructure.…”